Stahl-electronics
We offer customized cryogenic amplifiers e.g. for STM/AFM applications, FT-ICR ion traps and QPC measurements. Our cryogenic low noise amplifiers are developed with focus on small shot noise signals. |
The HFC 50 D/E represents an ultra low noise 2-channel FET preamplifier, operating in room temperature down to deep cryogenic environments (T = 4.2K, liquid Helium). It is an improved version of the predecessor version HFC 50 B/C. Version HFC 50 E equals version HFC 50 D, but offers an additional (uncalibrated) silicon temperature diode for temperature monitoring. The device has been developed in close collaboration with a University group for low temperature shot noise measurements on quantum point contacts beyond the 1/f noise kink in the noise spectra. Improvements:
Data sheet of the predecessor version HFC 50 B/C: pdf, 2.90 MB |
The KC 05 du module comprises 2 highly sensitive voltage preamplifier channels, and is intended for lowtemperature, low-noise applications. The circuit can be used directly inside a cryogenic vacuum setup. GaAs (Gallium-Arsenide)-FET technology allows for operation in strong magnetic fields up to several Tesla, as they are present in NMR, FT-ICR or solid state research applications. Key Features:
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The new BUF 0.12 device is a CMOS-based precision buffer amplifier, operating in room temperature down to deep cryogenic environments (T = 4.2K, liquid Helium). The BUF 0.12 covers a frequency range from 0Hz to 0.12MHz (in terms of max. 1% voltage deviation), features a very high input impedance and has an input voltage noise in the order of 5nV/√Hz. The device is based on highly-doped Silicon CMOS technology, which allows for operation over a very wide temperature range from room temperature to liquid Helium temperature, provided the device is located in a vacuum cryostat. Key Features:
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The A3, A7 and RTA50 amplifier units consist of three main blocks, which are useful to operate cryogenic preamplifiers. The supply section feeds a cryogenic device with stable supply voltage. Another section provides low noise post-amplification of the signals coming from the cryogenic stage. The third section allows monitoring the biasing conditions (DC values) and gives assistance in analysing possible malfunctions and cabling problems in the inaccessible cryogenic region. The device is housed inside a shielded aluminium case, which needs to be powered up by an external +/-5V supply. |
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Our 3rd generation drift-compensated GaAs-preamplifier shows outstanding noise performance and versatility. For more details please refer to the short form data sheet: pdf, 280 KB |
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